Invention Grant
- Patent Title: Interferometric lithographic projection apparatus
- Patent Title (中): 干涉光刻投影仪
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Application No.: US11341381Application Date: 2006-01-30
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Publication No.: US07751030B2Publication Date: 2010-07-06
- Inventor: Louis Markoya , Aleksandr Khmelichek , Diane C. McCafferty , Harry Sewell , Justin L. Kreuzer
- Applicant: Louis Markoya , Aleksandr Khmelichek , Diane C. McCafferty , Harry Sewell , Justin L. Kreuzer
- Applicant Address: NL Veldhoven
- Assignee: ASML Holding N.V.
- Current Assignee: ASML Holding N.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: G03B27/54
- IPC: G03B27/54

Abstract:
A lithographic projection apparatus includes an illumination system, an interchangeable upper optics module, and a lower optics module. The illumination system provides a beam of radiation. The interchangeable upper optics module receives the beam and includes, sequentially, a beam splitter that splits the beam into portions, an aperture plate, and a plurality of reflecting surfaces. The lower optics module receives portions of the beam from respective ones the reflecting surfaces and directs the portions of the beam onto a substrate. Interference fringes or contact hole patterns are formed on the substrate using the portions of the beam.
Public/Granted literature
- US20060170896A1 Interferometric lithographic projection apparatus Public/Granted day:2006-08-03
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