Invention Grant
- Patent Title: Interference objective for annular test surfaces
- Patent Title (中): 环形试验表面的干涉目标
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Application No.: US12017612Application Date: 2008-01-22
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Publication No.: US07751064B2Publication Date: 2010-07-06
- Inventor: Jan Liesener , James F. Biegen
- Applicant: Jan Liesener , James F. Biegen
- Applicant Address: US CT Middlefield
- Assignee: Zygo Corporation
- Current Assignee: Zygo Corporation
- Current Assignee Address: US CT Middlefield
- Agency: Fish & Richardson P.C.
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
An apparatus including: an interferometric objective comprising a beam splitter surface configured to separate input light into test light and reference light, and a reference surface configured to receive the reference light and direct it back to the beam splitter surface, which is configured to recombine the reference light with test light reflected from a test surface, the interferometric objective further comprising one or more optical elements positioned in the path of the input light and having positive or negative optical power, wherein the reference surface is curved and defines a window to pass the input light towards the beam splitter surface.
Public/Granted literature
- US20090185195A1 INTERFERENCE OBJECTIVE FOR ANNULAR TEST SURFACES Public/Granted day:2009-07-23
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