Invention Grant
- Patent Title: Thin-film capacitor with a field modification layer
- Patent Title (中): 具有场改性层的薄膜电容器
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Application No.: US12431288Application Date: 2009-04-28
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Publication No.: US07751177B2Publication Date: 2010-07-06
- Inventor: Douglas R. Roberts , Eric D. Luckowski , Shahid Rauf , Peter L. G. Ventzek
- Applicant: Douglas R. Roberts , Eric D. Luckowski , Shahid Rauf , Peter L. G. Ventzek
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc
- Current Assignee: Freescale Semiconductor, Inc
- Current Assignee Address: US TX Austin
- Main IPC: H01G4/06
- IPC: H01G4/06

Abstract:
A method for forming a capacitor includes providing a metal-containing bottom electrode, forming a capacitor insulator over the metal-containing bottom electrode, forming a metal-containing top electrode over the capacitor insulator, and forming a dielectric-containing field modification layer over the capacitor insulator and at least partially surrounding the metal-containing top electrode. Forming the dielectric-containing field modification layer may include oxidizing a sidewall of the metal-containing field modification layer. A barrier layer may be formed over the capacitor insulator prior to forming the metal-containing top electrode.
Public/Granted literature
- US20090279226A1 THIN-FILM CAPACITOR WITH A FIELD MODIFICATION LAYER Public/Granted day:2009-11-12
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