Invention Grant
- Patent Title: Memory device including a programmable resistance element
- Patent Title (中): 存储器件包括可编程电阻元件
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Application No.: US12500673Application Date: 2009-07-10
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Publication No.: US07751227B2Publication Date: 2010-07-06
- Inventor: Yukio Fuji
- Applicant: Yukio Fuji
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2005-011626 20050119
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
Disclosed are a phase change memory with improved retention characteristic of a phase change device, and a method for refreshing the phase change memory. The fact that a memory is a DRAM interface compatible memory is exploited. There are provided dummy cells stressed in accordance with the number of times of read and write operations. Changes in the resistance value of the dummy cells are detected by comparator circuits. If the resistance value have been changed beyond a predetermined reference value (that is, changed to a low resistance), a refresh request circuit requests an internal circuit, not shown, to effect refreshing. The memory cells and the dummy cells are transitorily refreshed and correction is made for variations in the programmed resistance value of the phase change devices to assure the margin as well as to improve retention characteristic.
Public/Granted literature
- US20090273970A1 MEMORY DEVICE INCLUDING A PROGRAMMABLE RESISTANCE ELEMENT Public/Granted day:2009-11-05
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