Invention Grant
- Patent Title: Read method of memory device
- Patent Title (中): 读存储器件的方法
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Application No.: US12422870Application Date: 2009-04-13
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Publication No.: US07751241B2Publication Date: 2010-07-06
- Inventor: Jong Hyun Wang , Jun Seop Chung , Seok Jin Joo
- Applicant: Jong Hyun Wang , Jun Seop Chung , Seok Jin Joo
- Applicant Address: KR Icheon-si
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Icheon-si
- Agency: Townsend and Townsend and Crew LLP
- Priority: KR10-2007-0017927 20070222
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
A read method of a memory device including a MLC includes the steps of performing a data read operation according to a first read command; determining whether error correction of the read data is possible; if, as a result of the determination, error correction is difficult, performing a data read operation according to a second read command; determining whether error correction of read data is possible according to the second read command; and if, as a result of the determination, error correction is difficult, performing a data read operation according to a Nth (N≧3, N is an integer) read command.
Public/Granted literature
- US20090201727A1 READ METHOD OF MEMORY DEVICE Public/Granted day:2009-08-13
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