Invention Grant
US07751261B2 Method and apparatus for controlling read latency of high-speed DRAM
有权
控制高速DRAM读延迟的方法和装置
- Patent Title: Method and apparatus for controlling read latency of high-speed DRAM
- Patent Title (中): 控制高速DRAM读延迟的方法和装置
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Application No.: US12010700Application Date: 2008-01-29
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Publication No.: US07751261B2Publication Date: 2010-07-06
- Inventor: Yong-ho Cho
- Applicant: Yong-ho Cho
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2007-0013339 20070208
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
Provided are a method and apparatus for controlling a read latency of a high-speed DRAM. A memory device may include a delay measurement unit, a delay locked loop, a latency counter and a data output buffer. The delay measurement unit measures a delay time between when an external clock signal is input and when read data is output to generate measurement signals and generates a first internal clock signal delayed from the external clock signal. The delay locked loop (DLL) receives the first internal clock signal and generates a second internal clock signal synchronized with the external clock signal. The latency counter generates a latency signal from an external read command signal in response to the measurement signals, and the data output buffer outputs the read data in response to the latency signal and the second internal clock signal.
Public/Granted literature
- US20080192563A1 Method and apparatus for controlling read latency of high-speed DRAM Public/Granted day:2008-08-14
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