Invention Grant
- Patent Title: Test-write method, information recording method, and information recording apparatus
- Patent Title (中): 测试写入方法，信息记录方法和信息记录装置
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Application No.: US10931040Application Date: 2004-09-01
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Publication No.: US07751293B2Publication Date: 2010-07-06
- Inventor: Junko Ushiyama , Toshimichi Shintani , Hiroyuki Minemura
- Applicant: Junko Ushiyama , Toshimichi Shintani , Hiroyuki Minemura
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2004-222742 20040730
- Main IPC: G11B7/00
- IPC: G11B7/00
Abstract:
A test-write method for accurately and quickly determining recording conditions, and an apparatus suitable therefor. In a 2T-based strategy, recording pulse conditions are determined by separately test-writing an even-number length mark and an odd-number length mark, and then the relative positions of the even-number length mark and the odd-number length mark at the recording pulse start time are adjusted.
Public/Granted literature
- US20060023591A1 Test-write method, information recording method, and information recording apparatus Public/Granted day:2006-02-02
Information query
IPC分类:
