Invention Grant
- Patent Title: Apparatus for inspecting appearance of inspection piece
- Patent Title (中): 用于检查检验件外观的装置
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Application No.: US11314094Application Date: 2005-12-22
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Publication No.: US07751611B2Publication Date: 2010-07-06
- Inventor: Yoshihiro Akiyama , Yong Yang , Sakie Akiyama
- Applicant: Yoshihiro Akiyama , Yong Yang , Sakie Akiyama
- Applicant Address: JP Tokyo
- Assignee: Saki Corporation
- Current Assignee: Saki Corporation
- Current Assignee Address: JP Tokyo
- Agent Ralph A Dowell; Neil Henderson
- Priority: JP2004-373741 20041224
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
An appearance inspection apparatus for inspecting a board is provided with multiple imaging units for capturing respective images of the board. Multiple slave personal computers respectively provided for the multiple imaging units inspect the board by referring to data of images of the board captured by the respective imaging units. Each of the multiple slave personal computers transmits, to other slave personal computers, shared data that are necessary for inspection by other slave personal computers. The shared data is acquired by each of the slave personal computers from data of an image of the inspection piece captured by an associated imaging unit. Each of the slave personal computers inspects an appearance of the board by referring to the shared data received from another slave personal computer.
Public/Granted literature
- US20060165274A1 Apparatus for inspecting appearance of inspection piece Public/Granted day:2006-07-27
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