Invention Grant
- Patent Title: Molecule measuring device and molecule measuring method
- Patent Title (中): 分子测量装置和分子测量方法
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Application No.: US11658728Application Date: 2005-07-08
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Publication No.: US07752897B2Publication Date: 2010-07-13
- Inventor: Takaharu Okajima , Hiroshi Tokumoto
- Applicant: Takaharu Okajima , Hiroshi Tokumoto
- Applicant Address: JP Hokkaido
- Assignee: National University Corporation Hokkaido University
- Current Assignee: National University Corporation Hokkaido University
- Current Assignee Address: JP Hokkaido
- Agency: The Nath Law Group
- Priority: JP2004-224573 20040730
- International Application: PCT/JP2005/012689 WO 20050708
- International Announcement: WO2006/011348 WO 20060202
- Main IPC: G01B5/28
- IPC: G01B5/28

Abstract:
A molecule measuring apparatus capable of controlling the drawing directions of molecules always in a uniaxial direction in a measurement performed by extending and retracting the molecules on a substrate. In the apparatus, a cantilever (200) lifts one end of a molecule (900) on the substrate (100), and a control section controls the peeling point of the molecules, which is a boundary between the portion of the molecule (900) in contact with the substrate (100) and the portion of the molecule (900) separated from the substrate (100) by the lifting, and the position of the cantilever (200) so that the peeling point and the position of the cantilever (200) are positioned vertical to the substrate (100).
Public/Granted literature
- US20080289404A1 Molecule Measuring Device and Molecule Measuring Method Public/Granted day:2008-11-27
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