Invention Grant
- Patent Title: Method for measuring surface plasmon resonance
- Patent Title (中): 表面等离子体共振测量方法
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Application No.: US11085071Application Date: 2005-03-22
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Publication No.: US07754493B2Publication Date: 2010-07-13
- Inventor: Hirohiko Tsuzuki
- Applicant: Hirohiko Tsuzuki
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2004-093051 20040326; JP2004-093052 20040326
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/55 ; G01N33/53 ; G01N35/08

Abstract:
An object of the present invention is to suppress variations in measurement values when measuring a specific binding reaction between a physiologically active substance and a tested substance using a surface plasmon resonance measurement device, so that binding detection data with high reliability is obtained. The present invention provides a method for measuring a change in surface plasmon resonance, which comprises: using a surface plasmon resonance measurement device comprising a flow channel system having a cell formed on a metal film and a light-detecting means for detecting the state of surface plasmon resonance by measuring the intensity of a light beam totally reflected on the metal film; and exchanging the liquid contained in the above flow channel system, wherein a major axis of the metal film is 0.1 μm or more and 100 μm or less; a molecule interacting with an analyzed molecule is immobilized on the surface of the metal film; the distance between metal films is 200 μm or more and 10 mm or less; and the molecule interacting with the analyzed molecule is not immobilized on any parts other than the metal films.
Public/Granted literature
- US20050216205A1 Method for measuring surface plasmon resonance Public/Granted day:2005-09-29
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