Invention Grant
- Patent Title: Transmission electron microscope
- Patent Title (中): 透射电子显微镜
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Application No.: US12010702Application Date: 2008-01-29
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Publication No.: US07755046B2Publication Date: 2010-07-13
- Inventor: Teruo Kohashi , Takashi Ohshima , Takao Matsumoto , Hirokazu Nishida
- Applicant: Teruo Kohashi , Takashi Ohshima , Takao Matsumoto , Hirokazu Nishida
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Stites & Harbison, PLLC
- Agent Juan Carlos A. Marquez, Esq.
- Priority: JP2007-050921 20070301
- Main IPC: G01N23/00
- IPC: G01N23/00 ; G21K7/00

Abstract:
Chirality distribution in the molecular structure of protein or the like and magnetic domain structure are analyzed with high resolution less than 10 nm. A transmission electron microscope equipped with a spin-polarized electron source is used for holography observation. The phase of transmission spin-polarized electrons changes due to the existence of chirality structure or magnetization in a sample, which is observed as an interference pattern phase shift in holography measurement.
Public/Granted literature
- US20080210868A1 Transmission electron microscope Public/Granted day:2008-09-04
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