Invention Grant
- Patent Title: UV blocking and crack protecting passivation layer
- Patent Title (中): UV阻挡和裂纹保护钝化层
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Application No.: US11352169Application Date: 2006-02-10
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Publication No.: US07755197B2Publication Date: 2010-07-13
- Inventor: Lee Jen Chen , Shing Ann Luo , Chin Ta Su
- Applicant: Lee Jen Chen , Shing Ann Luo , Chin Ta Su
- Applicant Address: TW Hsinchu
- Assignee: Macronix International Co., Ltd.
- Current Assignee: Macronix International Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes Beffel & Wolfeld, LLP
- Main IPC: H01L23/48
- IPC: H01L23/48

Abstract:
A semiconductor device comprises a substrate, a patterned metal conductor layer over the substrate, and a passivation layer. The passivation layer may comprise a UV blocking, protection layer, over at least a portion of the substrate and patterned metal conductor layers, and a separation layer between the patterned metal conductor layer and the UV protection layer. The passivation layer may also comprise a gap-filling, hydrogen-blocking layer over the substrate, the patterned metal conductor layer and any UV protection layer.
Public/Granted literature
- US20070187813A1 UV blocking and crack protecting passivation layer Public/Granted day:2007-08-16
Information query
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