An apparatus for testing semiconductor devices includes a first member configured as a drawer to be movable in and out of the housing and to receive a tray assembly containing semiconductor devices having exposed electrical contacts. The tray assembly includes a top portion and a bottom portion. The bottom portion includes structures for retaining the semiconductor devices in fixed positions and tray openings providing access to the electrical contacts. The top portion includes surfaces for contacting the semiconductor devices and a stress relief structure on the top. A second member moves the first member in a vertical direction to a tester pack. The tester pack sends and receives electrical signals to and from the semiconductor devices by way of the electrical contacts. A test computer provides instruction to the tester pack allowing the tester pack to test the semiconductor devices and return test information to the test computer.