Invention Grant
- Patent Title: Driver circuit and test apparatus
- Patent Title (中): 驱动电路和测试仪器
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Application No.: US11941086Application Date: 2007-11-16
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Publication No.: US07755377B2Publication Date: 2010-07-13
- Inventor: Kensuke Kamo , Takashi Sekino , Toshiaki Awaji
- Applicant: Kensuke Kamo , Takashi Sekino , Toshiaki Awaji
- Applicant Address: JP
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP
- Agency: Chen Yoshimura LLP
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
Provided is a driver circuit that has a first operational mode and a second operational mode and outputs an output signal according to an input signal. The driver circuit includes a first driver section that, in the first operational mode, generates and outputs the output signal according to the input signal and, in the second operational mode, is controlled to be disabled; a high precision driver section that, in the first operational mode, is controlled to be disabled and, in the second operational mode, outputs a source power having a predetermined voltage; and a second driver section that, in the first operational mode, receives the output signal output by the first driver section and outputs the received signal to the outside and, in the second operational mode, receives the source power from the high precision driver section, generates the output signal according to the input signal, and outputs the thus generated signal to the outside.
Public/Granted literature
- US20090128182A1 DRIVER CIRCUIT AND TEST APPARATUS Public/Granted day:2009-05-21
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