Invention Grant
- Patent Title: Variable delay circuit, testing apparatus, and electronic device
- Patent Title (中): 可变延迟电路,测试仪器和电子设备
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Application No.: US12233616Application Date: 2008-09-19
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Publication No.: US07755407B2Publication Date: 2010-07-13
- Inventor: Takuya Hasumi , Masakatsu Suda , Satoshi Sudou
- Applicant: Takuya Hasumi , Masakatsu Suda , Satoshi Sudou
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Osha • Liang LLP
- Priority: JP2006-099359 20060331
- Main IPC: H03H11/26
- IPC: H03H11/26

Abstract:
Provided is a variable delay circuit outputting an output signal delayed with respect to an input signal by a designated delay time, including: a delay controller outputting a control voltage according to the delay time; a MOS transistor receiving the control voltage at a gate, and outputs a drain current according to the control voltage; a correction section connected in parallel to a source and a drain of the current controlling MOS transistor, and outputs a correction current on a monotonic decrease as the drain current increases in a range larger than a predetermined boundary current within a normal usage range of the drain current; and a delay element running an output current resulting from adding the correction current to the drain current, between the delay element and an output terminal of the variable delay circuit, in changing a signal value of the output signal according to the input signal.
Public/Granted literature
- US20090039939A1 VARIABLE DELAY CIRCUIT, TESTING APPARATUS, AND ELECTRONIC DEVICE Public/Granted day:2009-02-12
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