Invention Grant
- Patent Title: Image signal processor and deficient pixel detection method
- Patent Title (中): 图像信号处理器和缺陷像素检测方法
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Application No.: US11426754Application Date: 2006-06-27
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Publication No.: US07755680B2Publication Date: 2010-07-13
- Inventor: Tohru Watanabe
- Applicant: Tohru Watanabe
- Applicant Address: JP Osaka
- Assignee: Sanyo Electric Co., Ltd.
- Current Assignee: Sanyo Electric Co., Ltd.
- Current Assignee Address: JP Osaka
- Agency: Fish & Richardson P.C.
- Priority: JP11-305805 19991027; JP11-307125 19991028; JP2000-282166 20000918
- Main IPC: H04N9/64
- IPC: H04N9/64

Abstract:
A deficiency candidate detection circuit detects a deficient pixel candidate by comparing the image signal of a target pixel with the image signals of peripheral pixels, and address information of the deficient pixel candidate is stored in a position memory circuit. A deficiency determining circuit repeats the determination of a deficient pixel a number of times based on the address information stored in the position memory circuit, and determines address information of a deficient pixel from the continuity of the determination results. A deficiency registering circuit registers the determined address information in the position memory circuit. A deficiency correction circuit corrects the image signal of the deficient pixel according to the registered address information of the deficient pixel.
Public/Granted literature
- US20060233431A1 Image Signal Processor and Deficient Pixel Detection Method Public/Granted day:2006-10-19
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