Invention Grant
- Patent Title: Method for mapping geometrical features with opto-electronic arrays
- Patent Title (中): 用光电子阵列映射几何特征的方法
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Application No.: US11308431Application Date: 2006-03-24
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Publication No.: US07755770B2Publication Date: 2010-07-13
- Inventor: Herve Ohmer
- Applicant: Herve Ohmer
- Applicant Address: US TX Sugar Land
- Assignee: Schlumberger Technology Corporation
- Current Assignee: Schlumberger Technology Corporation
- Current Assignee Address: US TX Sugar Land
- Agency: Osha Liang LLP
- Agent David G. Matthews; Rodney V. Warfford
- Main IPC: G01B11/24
- IPC: G01B11/24

Abstract:
A method for inspecting a surface of an object, including scanning the surface using an array of opto-electronic sensors, obtaining a reflected light signal from a location on the surface, combining the light signals to form a representation of geometrical features of the surface, and processing the representation to obtain geometric quantities of the geometrical features. An apparatus for inspecting a well screen, including an array of a plurality of opto-electronic sensors, a motion control unit, and a processor for obtaining a geometric quantity of the well screen based on an image obtained by the sensor array and the location registered by the motion control unit.
Public/Granted literature
- US20070236688A1 Method for Mapping Geometrical Features with Opto-Electronic Arrays Public/Granted day:2007-10-11
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