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US07755770B2 Method for mapping geometrical features with opto-electronic arrays 失效
用光电子阵列映射几何特征的方法

Method for mapping geometrical features with opto-electronic arrays
Abstract:
A method for inspecting a surface of an object, including scanning the surface using an array of opto-electronic sensors, obtaining a reflected light signal from a location on the surface, combining the light signals to form a representation of geometrical features of the surface, and processing the representation to obtain geometric quantities of the geometrical features. An apparatus for inspecting a well screen, including an array of a plurality of opto-electronic sensors, a motion control unit, and a processor for obtaining a geometric quantity of the well screen based on an image obtained by the sensor array and the location registered by the motion control unit.
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