Invention Grant
- Patent Title: Resistance change memory device
- Patent Title (中): 电阻变化记忆装置
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Application No.: US11761772Application Date: 2007-06-12
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Publication No.: US07755934B2Publication Date: 2010-07-13
- Inventor: Haruki Toda , Koichi Kubo
- Applicant: Haruki Toda , Koichi Kubo
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A resistance change memory device including: a substrate; cell arrays stacked thereabove, each including a matrix layout of memory cells; a write circuit configured to write a pair cell constituted by two neighboring memory cells; and a read circuit configured to read complementary resistance value states of the pair cell as one bit of data, wherein the memory cell includes a variable resistance element for storing as information a resistance value, which has a recording layer composed of a composite compound containing at least two types of cation elements, at least one type of the cation element being a transition element having “d”-orbit, in which electrons are incompletely filled, the shortest distance between adjacent cation elements being 0.32 nm or less.
Public/Granted literature
- US20070285970A1 RESISTANCE CHANGE MEMORY DEVICE Public/Granted day:2007-12-13
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