Invention Grant
- Patent Title: Block erase for phase change memory
- Patent Title (中): 块擦除相变存储器
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Application No.: US11828717Application Date: 2007-07-26
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Publication No.: US07755935B2Publication Date: 2010-07-13
- Inventor: Chung Hon Lam , Hsiang-Lan Lung
- Applicant: Chung Hon Lam , Hsiang-Lan Lung
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Ryan, Mason & Lewis, LLP
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
An embodiment of our invention includes a method of programming at least one phase change memory block, the at least one block comprising at least one phase change memory cell, the at least one cell comprising at least one phase change material. The method includes the steps of transitioning all cells within the at least one block to a first state and, after all cells within the at least one block have been transitioned to the first state, transitioning at least one cell within the at least one block to at least a second state. Transitioning a cell to the at least second state is faster than transitioning a cell to the first state. At least the step of transitioning all cells within the at least one block to a first state may include transitioning all cells within the at least one block in a substantially simultaneous manner.
Public/Granted literature
- US20090027950A1 Block Erase for Phase Change Memory Public/Granted day:2009-01-29
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