Invention Grant
- Patent Title: Temperature dependent system for reading ST-RAM
- Patent Title (中): 读取ST-RAM的依赖温度的系统
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Application No.: US12250036Application Date: 2008-10-13
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Publication No.: US07755965B2Publication Date: 2010-07-13
- Inventor: Yiran Chen , Hai Li , Hongyue Liu , Henry F. Huang , Yong Lu
- Applicant: Yiran Chen , Hai Li , Hongyue Liu , Henry F. Huang , Yong Lu
- Applicant Address: US CA Scotts Valley
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Scotts Valley
- Agency: Campbell Nelson Whipps LLC
- Main IPC: G11C7/04
- IPC: G11C7/04 ; G11C11/00 ; G11C7/02

Abstract:
A memory device that includes at least one memory cell, the memory cell includes: a magnetic tunnel junction (MTJ); and a transistor, wherein the transistor is operatively coupled to the MTJ; a bit line; a source line; and a word line, wherein the memory cell is operatively coupled between the bit line and the source line, and the word line is operatively coupled to the transistor; a temperature sensor; and control circuitry, wherein the temperature sensor is operatively coupled to the control circuitry and the control circuitry and temperature sensor are configured to control a current across the memory cell.
Public/Granted literature
- US20100091562A1 TEMPERATURE DEPENDENT SYSTEM FOR READING ST-RAM Public/Granted day:2010-04-15
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