Invention Grant
US07756357B2 Microscope system for obtaining high and low magnification images
有权
显微镜系统,用于获得高和低倍率的图像
- Patent Title: Microscope system for obtaining high and low magnification images
- Patent Title (中): 显微镜系统,用于获得高和低倍率的图像
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Application No.: US10871817Application Date: 2004-06-17
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Publication No.: US07756357B2Publication Date: 2010-07-13
- Inventor: Takashi Yoneyama
- Applicant: Takashi Yoneyama
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Frishauf, Holtz, Goodman & Chick, P.C.
- Priority: JP2003-270221 20030701
- Main IPC: G06K9/40
- IPC: G06K9/40 ; G06K9/36 ; G02B23/00

Abstract:
A host system defines a plurality of partial areas for a observation object which is a sample, obtains a partial image of an observation object in the partial area captured using a TV camera at the interval of the depth of focus of an objective lens in the depth-of-focus direction of the objective lens, generates from the partial images a focused partial image in which an object contained in the partial area is represented in a focusing state regardless of the difference in a position in the depth-of-focus direction, and generates and displays a focused image of an observation object by combining focused partial images generated in the respective partial area.
Public/Granted literature
- US20050002587A1 Microscope system Public/Granted day:2005-01-06
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