Invention Grant
- Patent Title: High-frequency measuring system having spatially separated high-frequency modules
- Patent Title (中): 高频测量系统具有空间分离的高频模块
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Application No.: US10563030Application Date: 2004-05-27
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Publication No.: US07756516B2Publication Date: 2010-07-13
- Inventor: Roland Steffen , Ralf Plaumann
- Applicant: Roland Steffen , Ralf Plaumann
- Applicant Address: DE Munich
- Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee Address: DE Munich
- Agency: Ditthavong Mori & Steiner, P.C.
- Priority: DE10329396 20030630
- International Application: PCT/EP2004/005728 WO 20040527
- International Announcement: WO2005/001491 WO 20050106
- Main IPC: H04Q7/20
- IPC: H04Q7/20
Abstract:
A high-frequency measuring system is provided for measuring a test device with a measuring device unit and at least one high-frequency module connected to the measuring device unit. Each high-frequency module is located spatially separated from the measuring device unit and is connected to the measuring device unit via a digital interface.
Public/Granted literature
- US20060258293A1 High-frequency measuring system having spatially separated high-frequency modules Public/Granted day:2006-11-16
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