Invention Grant
US07756683B2 Measuring device and method for measuring at least one environmental parameter
有权
用于测量至少一个环境参数的测量装置和方法
- Patent Title: Measuring device and method for measuring at least one environmental parameter
- Patent Title (中): 用于测量至少一个环境参数的测量装置和方法
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Application No.: US11572072Application Date: 2005-07-08
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Publication No.: US07756683B2Publication Date: 2010-07-13
- Inventor: Traugott Kilgus
- Applicant: Traugott Kilgus
- Applicant Address: AT Moedling
- Assignee: MLU-Monitoring fuer Leben und Umwelt GES.m.b.H.
- Current Assignee: MLU-Monitoring fuer Leben und Umwelt GES.m.b.H.
- Current Assignee Address: AT Moedling
- Agency: Workman Nydegger
- Priority: ATGM488/2004 20040712; ATGM911/2004 20041215
- International Application: PCT/AT2005/000260 WO 20050708
- International Announcement: WO2006/005093 WO 20060119
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A process for measuring at least one environmental parameter with at least one sensor (7.1, 7.2, . . . ), wherein environmental parameters detected by the sensor are converted into measured values of physical variables and are retrievable via a long-distance data connection, is characterized in that the environmental parameters detected by the sensor (7.1, 7.2, . . . ) are taken over in the form of voltage signals from a processor system of a data acquisition and processing unit (6) which calculates therefrom physical measured values in two steps while taking into account the progressions of calibration, stores said calculated measured values in database form along with the voltage signals, preferably making them available via a web server function, wherein, in a first step, voltage values which have been digitized and, possibly, have been preprocessed by statistical arithmetic operations are made available and, in a second step, the measured values are calculated therefrom (FIG. 1).
Public/Granted literature
- US20080040041A1 Measuring Device And Method For Measuring At Least One Environmental Parameter Public/Granted day:2008-02-14
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