Invention Grant
US07757129B2 Generalized trace and log facility for first error data collection
有权
用于首次错误数据收集的通用跟踪和日志功能
- Patent Title: Generalized trace and log facility for first error data collection
- Patent Title (中): 用于首次错误数据收集的通用跟踪和日志功能
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Application No.: US11694228Application Date: 2007-03-30
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Publication No.: US07757129B2Publication Date: 2010-07-13
- Inventor: Theodore J. Bohizic , Richard T. Brandle , Gary R. Morrill
- Applicant: Theodore J. Bohizic , Richard T. Brandle , Gary R. Morrill
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Heslin Rothenberg Farley & Mesiti, P.C.
- Agent John E. Campbell; Kevin P. Radigan, Esq.
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A generalized trace and log facility is employed to collect data, including data associated with the first occurrence of an error. The facility provides standardized application programming interfaces to be used to collect data, print the data, and forward the data to a support team, if desired.
Public/Granted literature
- US20080244328A1 GENERALIZED TRACE AND LOG FACILITY FOR FIRST ERROR DATA COLLECTION Public/Granted day:2008-10-02
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