Invention Grant
- Patent Title: Ophthalmic apparatus
- Patent Title (中): 眼科仪器
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Application No.: US12225736Application Date: 2007-04-02
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Publication No.: US07771050B2Publication Date: 2010-08-10
- Inventor: Naoto Honda , Shigekazu Takada , Kazuhiro Yoshimura , Naoki Isogai , Akihiro Hayashi
- Applicant: Naoto Honda , Shigekazu Takada , Kazuhiro Yoshimura , Naoki Isogai , Akihiro Hayashi
- Applicant Address: JP Gamagori-shi
- Assignee: Nidek Co., Ltd.
- Current Assignee: Nidek Co., Ltd.
- Current Assignee Address: JP Gamagori-shi
- Agency: Oliff & Berridge, PLC
- Priority: JP2006-096929 20060331; JP2006-096930 20060331; JP2006-110163 20060412; JP2007-050156 20070228; JP2007-050157 20070228
- International Application: PCT/JP2007/057397 WO 20070402
- International Announcement: WO2007/114426 WO 20071011
- Main IPC: A61B3/14
- IPC: A61B3/14 ; A61B3/10 ; A61B3/00

Abstract:
To provide an ophthalmic apparatus capable of performing efficient measurement of a plurality of eye characteristics of an examinee's eye, which comprises a first measurement unit comprising a first measurement system for performing measurement of a first characteristic of the eye, a second measurement unit comprising a second measurement system for performing measurement of a second characteristic of the eye, a measurement unit in which the measurement units are placed such that heights of first and second measurement axes of the respective systems are different from each other, a movement mechanism unit moving the measurement unit in a vertical direction, and a control unit controlling the mechanism unit such that the height of the first measurement axis at the time of first measurement by the first measurement unit becomes almost the same as that of the second measurement axis at the time of second measurement by the second measurement unit.
Public/Granted literature
- US20090128778A1 Ophthalmic Apparatus Public/Granted day:2009-05-21
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