Invention Grant
- Patent Title: Method of forming a wire structure
- Patent Title (中): 形成线结构的方法
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Application No.: US12146729Application Date: 2008-06-26
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Publication No.: US07772103B2Publication Date: 2010-08-10
- Inventor: Ho-Jun Yi , Yong-Il Kim , Bong-Soo Kim , Dae-Young Jang , Woo-Jeong Cho
- Applicant: Ho-Jun Yi , Yong-Il Kim , Bong-Soo Kim , Dae-Young Jang , Woo-Jeong Cho
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co. Ltd
- Current Assignee: Samsung Electronics Co. Ltd
- Current Assignee Address: KR Suwon-si
- Agency: Stanzione & Kim LLP
- Priority: KR2007-63016 20070626
- Main IPC: H01L21/3205
- IPC: H01L21/3205 ; H01L21/4763

Abstract:
In a method of forming a wire structure, first active regions and second active regions are formed on a substrate. Each of the first active regions has a first sidewall of a positive slope and a second sidewall opposed to the first sidewall. The second active regions are arranged along a first direction. An isolation layer is between the first active regions and the second active regions. A first mask is formed on the first active regions, the second active regions and the isolation layer. The first mask has an opening exposing the first sidewall and extending along the first direction. The first active regions, the second active regions and the isolation layer are etched using the first mask to form a groove extending along the first direction and to form a fence having a height substantially higher than a bottom face of the groove. A wire is formed to fill the groove. A contact is formed on the wire. The contact is disposed toward the second active regions from the fence.
Public/Granted literature
- US20090035930A1 METHOD OF FORMING A WIRE STRUCTURE Public/Granted day:2009-02-05
Information query
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