Invention Grant
- Patent Title: Method of manufacturing a semiconductor device
- Patent Title (中): 制造半导体器件的方法
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Application No.: US12649821Application Date: 2009-12-30
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Publication No.: US07772112B2Publication Date: 2010-08-10
- Inventor: Yoshihisa Iba
- Applicant: Yoshihisa Iba
- Applicant Address: JP Yokohama
- Assignee: Fujitsu Semiconductor Limited
- Current Assignee: Fujitsu Semiconductor Limited
- Current Assignee Address: JP Yokohama
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2009-001841 20090107
- Main IPC: H01L21/4763
- IPC: H01L21/4763

Abstract:
A method of forming an insulating layer on an conductive layer; forming a first mask layer and a second mask layer on the insulating layer; forming a resist layer on the second mask layer; patterning the resist layer; patterning the second mask layer by using the resist layer as a mask; etching the first mask layer halfway through its thickness by using the resist layer and the second mask layer as a mask; removing the resist layer; etching a remaining portion of the first mask layer using the second mask layer as a mask; forming an interconnect groove by etching the insulating layer using the first mask layer as a mask; and forming an electrically conductive material into the interconnect groove, thereby forming an interconnect layer connected to the conductive layer.
Public/Granted literature
- US20100173491A1 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE Public/Granted day:2010-07-08
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