Invention Grant
US07772568B2 Micro sample heating probe and method of producing the same, and analyzer using the micro sample heating probe
有权
微型样品加热探针及其制作方法,分析仪采用微量样品加热探针
- Patent Title: Micro sample heating probe and method of producing the same, and analyzer using the micro sample heating probe
- Patent Title (中): 微型样品加热探针及其制作方法,分析仪采用微量样品加热探针
-
Application No.: US12204896Application Date: 2008-09-05
-
Publication No.: US07772568B2Publication Date: 2010-08-10
- Inventor: Kazuhiko Horikoshi , Naotoshi Akamatsu , Toshiaki Otani
- Applicant: Kazuhiko Horikoshi , Naotoshi Akamatsu , Toshiaki Otani
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2007-242375 20070919; JP2008-176750 20080707
- Main IPC: H01J49/26
- IPC: H01J49/26 ; H01J37/20 ; G01N30/02

Abstract:
An object of the present invention is to extract a micro foreign body of a few μm, which may cause a product defect of a device or the like, and to subject the foreign body to a mass analysis at a favorable S/N ratio without any contamination. A micro sample heating probe includes a sample holder made up of two members different in diameter, a supporting part, and a terminal part. The sample holder includes a heating mechanism only in a limited part, and just a region extremely close to the micro sample being an analysis target is heated locally. Therefore, even when a contaminated substance is attached to the probe, such substance is not heated, thereby preventing a noise from occurring, and enabling an analysis at a quite favorable S/N ratio.
Public/Granted literature
Information query