Invention Grant
- Patent Title: Semiconductor device and method of manufacturing the same
- Patent Title (中): 半导体装置及其制造方法
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Application No.: US12035964Application Date: 2008-02-22
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Publication No.: US07772699B2Publication Date: 2010-08-10
- Inventor: Shinya Hirata
- Applicant: Shinya Hirata
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2007/051268 20070301
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L21/44

Abstract:
A semiconductor device includes an electrode pad formed on a pad forming surface of a semiconductor integrated circuit chip, and a step formed on the pad forming surface to surround the electrode pad. A method of manufacturing the semiconductor device includes forming a metal film on a pad forming surface of a semiconductor integrated circuit chip, forming an electrode pad on a pad forming surface by selectively etching a metal film using a first mask pattern and forming a step to surround the electrode pad by selectively etching the pad forming surface using a second mask pattern.
Public/Granted literature
- US20080211094A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2008-09-04
Information query
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