Invention Grant
- Patent Title: Eddy current testing method
- Patent Title (中): 涡流检测方法
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Application No.: US12634156Application Date: 2009-12-09
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Publication No.: US07772840B2Publication Date: 2010-08-10
- Inventor: Yutaka Suzuki , Masahiro Koike , Tetsuya Matsui , Kojirou Kodaira , Katsumi Isaka , Mitsuru Odakura , Kenji Tayama , Kazuhiro Suzuki , Kenji Kumasaka , Yuuji Adachi
- Applicant: Yutaka Suzuki , Masahiro Koike , Tetsuya Matsui , Kojirou Kodaira , Katsumi Isaka , Mitsuru Odakura , Kenji Tayama , Kazuhiro Suzuki , Kenji Kumasaka , Yuuji Adachi
- Applicant Address: JP Tokyo JP Ibaraki
- Assignee: Hitachi, Ltd.,Hitachi Engineering & Services Co., Ltd.
- Current Assignee: Hitachi, Ltd.,Hitachi Engineering & Services Co., Ltd.
- Current Assignee Address: JP Tokyo JP Ibaraki
- Agency: Mattingly & Malur, P.C.
- Priority: JP2006-267571 20060929
- Main IPC: G01N27/87
- IPC: G01N27/87 ; G01N27/90 ; G01R33/00
Abstract:
The eddy current testing apparatus includes a probe having an eddy current testing sensor including a pair of eddy current testing coils. The apparatus also includes an eddy current testing flaw detector inputting detection signals from the eddy current testing sensor. The diameter of a magnetic core used in each of the pair of eddy current testing coils is within the range of 0.1 mm to 0.5 mm.
Public/Granted literature
- US20100085042A1 EDDY CURRENT TESTING APPARATUS AND EDDY CURRENT TESTING METHOD Public/Granted day:2010-04-08
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