Invention Grant
- Patent Title: High-conductivity contacting-type conductivity measurement
- Patent Title (中): 高导电率接触式电导率测量
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Application No.: US11899959Application Date: 2007-09-07
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Publication No.: US07772854B2Publication Date: 2010-08-10
- Inventor: Behzad Rezvani
- Applicant: Behzad Rezvani
- Applicant Address: US CA Irvine
- Assignee: Rosemount Analytical Inc.
- Current Assignee: Rosemount Analytical Inc.
- Current Assignee Address: US CA Irvine
- Agency: Westman, Champlin & Kelly, P.A.
- Agent Christopher R. Christenson
- Main IPC: G01R27/08
- IPC: G01R27/08 ; G01R27/02

Abstract:
An improved contacting-type conductivity measurement system and method are provided. A first conductivity measurement is obtained by driving a contacting-type conductivity sensor with an excitation voltage at a first frequency, a second conductivity is obtained by driving the contacting-type conductivity sensor with the excitation voltage at a second frequency. The first and second conductivity measurements are used to provide a more accurate conductivity output.
Public/Granted literature
- US20080061804A1 High-conductivity contacting-type conductivity measurement Public/Granted day:2008-03-13
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