Invention Grant
- Patent Title: Electromagnetic wave generation source searching method and current probe used therefor
- Patent Title (中): 电磁波发生源搜索方法及其电流探头
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Application No.: US11502435Application Date: 2006-08-11
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Publication No.: US07772856B2Publication Date: 2010-08-10
- Inventor: Hiroki Funato , Takashi Suga
- Applicant: Hiroki Funato , Takashi Suga
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2005-271318 20050920
- Main IPC: G01R27/08
- IPC: G01R27/08

Abstract:
A junction-current probe is provided which can measure a current flowing in a junction port adapted to connect a circuit board or an electronic apparatus to a chassis under the condition that the circuit board or electronic apparatus is packaged to the chassis. Structurally, the current probe has a circular or rectangular insulator having a hole in the center, a coiled conductor wire for converting linkage flux into voltage, an insulating member for preventing the insulator from making electrical contact with surroundings, an extraction lead for connecting opposite ends of the conductor wire to a cable and the cable for connection to a measurement unit. The current probe is reduced in thickness within in a range in which the condition of packaging to the chassis can remain unchanged.
Public/Granted literature
- US20070063717A1 Electromagnetic wave generation source searching method and current probe used therefor Public/Granted day:2007-03-22
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