Invention Grant
US07772862B2 Alignment method, tip position detecting device and probe apparatus
有权
校准方法,尖端位置检测装置和探针装置
- Patent Title: Alignment method, tip position detecting device and probe apparatus
- Patent Title (中): 校准方法,尖端位置检测装置和探针装置
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Application No.: US12416455Application Date: 2009-04-01
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Publication No.: US07772862B2Publication Date: 2010-08-10
- Inventor: Hiroshi Yamada , Masaru Suzuki , Tetsuji Watanabe , Takeshi Kawaji
- Applicant: Hiroshi Yamada , Masaru Suzuki , Tetsuji Watanabe , Takeshi Kawaji
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2008-096646 20080402
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
An alignment method is used in implementation of electric characteristic inspection of an object to be inspected via electric contact between the object disposed on a movable mounting table and probes. The alignment method includes detecting tip positions of the probes by using the tip position detecting device, detecting the tip positions of the probes, previously detected by the tip position detecting device, by using the second imaging unit, transferring needle marks of the probes onto a soft member provided at the tip position detecting device by allowing the probes to come into contact with the soft member, detecting the needle marks of the probes formed on the soft member by using the first imaging unit, and detecting inspection electrodes of the object corresponding to the probes by using the first imaging unit.
Public/Granted literature
- US20090251163A1 ALIGNMENT METHOD, TIP POSITION DETECTING DEVICE AND PROBE APPARATUS Public/Granted day:2009-10-08
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