Invention Grant
- Patent Title: Contact probe with reduced voltage drop and heat generation
- Patent Title (中): 接触探头具有降低的电压降和发热
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Application No.: US11889912Application Date: 2007-08-17
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Publication No.: US07772864B2Publication Date: 2010-08-10
- Inventor: Takahiro Nagata
- Applicant: Takahiro Nagata
- Applicant Address: JP Tokyo
- Assignee: Yokowo Co., Ltd.
- Current Assignee: Yokowo Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JP2006-223124 20060818
- Main IPC: G01R1/067
- IPC: G01R1/067

Abstract:
A contact probe includes a plurality of probes, each of the probes including: an conductive tube; an conductive plunger, contained in at least one end side of the tube, and having a distal end part protruding outward from the tube in an axial direction of the tube; and a coil spring, contained in the tube, and adapted to elastically urge the plunger outward. The plural probes are arranged in a first direction in a socket comprised of insulating material. A cross section of the tube in a direction perpendicular to the axial direction of the tube has a greater size in a direction different from the first direction than a size in the first direction.
Public/Granted literature
- US20080048702A1 Contact probe Public/Granted day:2008-02-28
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