Invention Grant
- Patent Title: Automatic measurement of video parameters
- Patent Title (中): 自动测量视频参数
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Application No.: US10224956Application Date: 2002-08-20
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Publication No.: US07773112B2Publication Date: 2010-08-10
- Inventor: Justin F. Whitling , Bozidar Janko , Kathryn A. Engholm , Frederick A. Azinger
- Applicant: Justin F. Whitling , Bozidar Janko , Kathryn A. Engholm , Frederick A. Azinger
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agent Francis I. Gray; Matthew D. Rabdau
- Main IPC: H04N17/00
- IPC: H04N17/00

Abstract:
A system and method for automatic measurement of video parameters for a video sequence using a video processor that has a software waveform monitor implemented as an integral part of a video processing application run by the video processor. Each frame of the processed video sequence, either in realtime as processed by the video processor, in near realtime after storage by the video processor in a storage device, or in the background for each video sequence stored in the storage device, is analyzed against specified parameters for legalization and/or color balancing of the video sequence. The analysis results may be reported as a display in several forms—an error image map, an error log, a timeline graphic, etc. The analysis results may also be provided to the video processor for automatic correction of the video sequence when the specified parameters are not satisfied.
Public/Granted literature
- US20040036773A1 Automatic measurement of video parameters Public/Granted day:2004-02-26
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