Invention Grant
- Patent Title: Differential pressure measuring system and differential pressure measuring method
- Patent Title (中): 差压测量系统和差压测量方法
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Application No.: US12461411Application Date: 2009-08-11
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Publication No.: US07773231B2Publication Date: 2010-08-10
- Inventor: Seiichiro Kinugasa
- Applicant: Seiichiro Kinugasa
- Applicant Address: JP Tokyo
- Assignee: Yamatake Corporation
- Current Assignee: Yamatake Corporation
- Current Assignee Address: JP Tokyo
- Agency: The Nath Law Group
- Agent Jerald L. Meyer; Jiaxiao Zhang
- Priority: JPP2005-290508 20051003
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G02B6/00

Abstract:
A differential pressure measuring system includes a light source for emitting a light, a first transducer for attenuating the intensity of the emitted light in a first range, depending on a first pressure, and providing a first light, a second transducer for attenuating the intensity of the first light in a second range, depending on a second pressure, and providing a second light, a feedback circuit for adjusting the intensity of the emitted light to maintain the intensity of the second light in the second range constant, and a measuring module for measuring a differential pressure between the first and second pressures, based on the intensities of the second light in the first and second ranges.
Public/Granted literature
- US20090301208A1 Differential pressure measuring system and differential pressure measuring method Public/Granted day:2009-12-10
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