Invention Grant
US07773445B2 Reading method and circuit for a non-volatile memory device based on the adaptive generation of a reference electrical quantity 有权
基于自适应生成参考电量的非易失性存储器件的读取方法和电路

Reading method and circuit for a non-volatile memory device based on the adaptive generation of a reference electrical quantity
Abstract:
A circuit for determining the value of a datum stored in an array memory cell of a non-volatile memory device having at least one reference memory cell of known content. The circuit has a determination stage, which compares an array electrical quantity, correlated to a current flowing in the array memory cell, with a reference electrical quantity, and supplies an output signal indicative of the datum, based on the comparison; and a generator circuit, provided with an input receiving a target electrical quantity correlated to a current flowing in use in the reference memory cell, and an output, which supplies the reference electrical quantity with a controlled value close or equal to that of the target electrical quantity. The generator circuit is provided with a variable generator, and a control unit connected to, and designed to control, the variable generator so that it will generate the controlled value of the reference electrical quantity.
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