Invention Grant
US07774150B2 Meter electronics and methods for determining one or more of a stiffness coefficient or a mass coefficient
有权
用于确定刚度系数或质量系数中的一个或多个的仪表电子学和方法
- Patent Title: Meter electronics and methods for determining one or more of a stiffness coefficient or a mass coefficient
- Patent Title (中): 用于确定刚度系数或质量系数中的一个或多个的仪表电子学和方法
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Application No.: US12067402Application Date: 2005-10-03
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Publication No.: US07774150B2Publication Date: 2010-08-10
- Inventor: Charles Paul Stack
- Applicant: Charles Paul Stack
- Applicant Address: US CO Boulder
- Assignee: Micro Motion, Inc.
- Current Assignee: Micro Motion, Inc.
- Current Assignee Address: US CO Boulder
- Agency: The Ollila Law Group LLC
- International Application: PCT/US2005/036201 WO 20051003
- International Announcement: WO2007/040542 WO 20070412
- Main IPC: G01F17/00
- IPC: G01F17/00 ; G01F1/20

Abstract:
A meter electronics (20) for a flow meter (5) is provided according to an embodiment of the invention. The meter electronics (20) includes an interface (201) for receiving a vibrational response and a processing system (203). The processing system (203) receives the vibrational response, vibrates at least one flowtube (130) of the vibratory flow meter (5) and generates a first tube period τm1 for a first flow material m1, vibrates the at least one flowtube (130) and generates a second tube period τm2 for a second flow material m2, and determines one or more of a stiffness coefficient C1 or a mass coefficient C2 from the first tube period τm1, a first density ρm1, the second tube period τm2, and a second density ρ2.
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