Invention Grant
US07774154B2 Test unit and test apparatus 有权
测试单元和测试仪器

Test unit and test apparatus
Abstract:
In the digitizer, a plurality of ADCs convert a plurality of analogue signals output from the device to be tested, to digital signals, respectively. The processing circuit is configured as a software-independent circuit and processes a plurality of digital signals output from the plurality of ADCs. The processing circuit is formed on the FPGA. In the processing circuit, the FFT circuit performs complex Fourier transform on two digital signals.
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