Invention Grant
- Patent Title: Test unit and test apparatus
- Patent Title (中): 测试单元和测试仪器
-
Application No.: US11811291Application Date: 2007-06-08
-
Publication No.: US07774154B2Publication Date: 2010-08-10
- Inventor: Norimasa Sato , Kenji Inaba
- Applicant: Norimasa Sato , Kenji Inaba
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Martine, Penilla & Gencarella, LLP
- Priority: JP2007-123568 20070508
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G06F17/40

Abstract:
In the digitizer, a plurality of ADCs convert a plurality of analogue signals output from the device to be tested, to digital signals, respectively. The processing circuit is configured as a software-independent circuit and processes a plurality of digital signals output from the plurality of ADCs. The processing circuit is formed on the FPGA. In the processing circuit, the FFT circuit performs complex Fourier transform on two digital signals.
Public/Granted literature
- US20080281538A1 Test unit and test apparatus Public/Granted day:2008-11-13
Information query