Invention Grant
- Patent Title: Analysis system
- Patent Title (中): 分析系统
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Application No.: US11934244Application Date: 2007-11-02
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Publication No.: US07774166B2Publication Date: 2010-08-10
- Inventor: Stefan Lindberg , Hakan Hedlund , Jim Kummelstam , Jarl-Ove Lindberg
- Applicant: Stefan Lindberg , Hakan Hedlund , Jim Kummelstam , Jarl-Ove Lindberg
- Applicant Address: SE Strangnas
- Assignee: SPM Instrument AB
- Current Assignee: SPM Instrument AB
- Current Assignee Address: SE Strangnas
- Agency: Young & Thompson
- Priority: SE0200147 20020118; SE0200215 20020125
- Main IPC: G06F3/00
- IPC: G06F3/00

Abstract:
An apparatus for analysing the condition of a machine having a rotating shaft, comprising: at least one input for receiving measurement data from a sensor for surveying a measuring point of the machine; said measurement data being dependent on rotation of said shaft; data processing means for processing condition data dependent on said measurement data; said data processing means comprising means for performing a plurality of condition monitoring functions (F1, F2, Fn), wherein said data processing means includes a Field Programmable Gate Array circuit coupled to said at least one input.
Public/Granted literature
- US20080059117A1 ANALYSIS SYSTEM Public/Granted day:2008-03-06
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