Invention Grant
US07774665B2 Apparatus for testing a phrase-locked loop in a boundary scan enabled device
有权
用于在边界扫描启用的设备中测试短语锁定环路的装置
- Patent Title: Apparatus for testing a phrase-locked loop in a boundary scan enabled device
- Patent Title (中): 用于在边界扫描启用的设备中测试短语锁定环路的装置
-
Application No.: US12198249Application Date: 2008-08-26
-
Publication No.: US07774665B2Publication Date: 2010-08-10
- Inventor: Wei-Min Kuo , Donald Y. Yu
- Applicant: Wei-Min Kuo , Donald Y. Yu
- Applicant Address: US CA Mountain View
- Assignee: Actel Corporation
- Current Assignee: Actel Corporation
- Current Assignee Address: US CA Mountain View
- Agency: Lewis and Roca LLP
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
An apparatus for interfacing a phase locked loop in a field programmable gate array. The apparatus comprising a phase locked loop cluster. The phase locked loop further comprising a plurality of RT modules, a plurality of RO modules, at least one TY module, a plurality of receiver modules and at least one buffer module. A phase locked loop selectively coupled to the RT modules, the RO modules, the TY modules, the receiver modules and at least one buffer module in the phase locked loop cluster.
Public/Granted literature
- US20090045855A1 APPARATUS FOR INTERFACING AND TESTING A PHASE LOCKED LOOP IN A FIELD PROGRAMMABLE GATE ARRAY Public/Granted day:2009-02-19
Information query
