Invention Grant
US07780345B2 Method and apparatus for a temperature sensor for measuring peak temperatures
失效
用于测量峰值温度的温度传感器的方法和装置
- Patent Title: Method and apparatus for a temperature sensor for measuring peak temperatures
- Patent Title (中): 用于测量峰值温度的温度传感器的方法和装置
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Application No.: US11959774Application Date: 2007-12-19
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Publication No.: US07780345B2Publication Date: 2010-08-24
- Inventor: Jerzy Wielgus , Daniel R. Gamota , John B. Szczech , Kin P. Tsui , Jie Zhang
- Applicant: Jerzy Wielgus , Daniel R. Gamota , John B. Szczech , Kin P. Tsui , Jie Zhang
- Applicant Address: US IL Schaumburg
- Assignee: Motorola, Inc.
- Current Assignee: Motorola, Inc.
- Current Assignee Address: US IL Schaumburg
- Main IPC: G01K3/00
- IPC: G01K3/00 ; G01K7/00 ; H01C7/04 ; H01C7/10 ; H01C3/04

Abstract:
A method and apparatus for an irreversible temperature sensor for measuring a peak exposure temperature. The apparatus is fabricated by printing an admixture of conductive nanoparticles on a dielectric substrate to form a film. The film has an electrical resistance that is inversely proportional to the exposure temperature. The electrical resistance also irreversibly decreases as the exposure temperature of the film increases. A portion of the film is exposed to a pulse of electromagnetic energy sufficient to render it substantially more electrically conductive than the portion that was not exposed. In use, the peak exposure temperature is determined by measuring the electrical resistance of the non-altered portion of the film and the electrical resistance of the portion that was exposed to the pulse of electromagnetic energy, and subtracting the electrical resistance of the altered portion from the electrical resistance of the portion that was not altered, to provide a difference value. The peak exposure temperature is then be calculated as a function of the difference value.
Public/Granted literature
- US20090161727A1 Method and Apparatus for a Temperature Sensor for Measuring Peak Temperatures Public/Granted day:2009-06-25
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