Invention Grant
- Patent Title: Thermal analyzer
- Patent Title (中): 热分析仪
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Application No.: US11809623Application Date: 2007-06-01
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Publication No.: US07781703B2Publication Date: 2010-08-24
- Inventor: Jun Nagasawa
- Applicant: Jun Nagasawa
- Applicant Address: JP Chiba
- Assignee: SII NanoTechnology Inc.
- Current Assignee: SII NanoTechnology Inc.
- Current Assignee Address: JP Chiba
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2006-155996 20060605
- Main IPC: B23K13/08
- IPC: B23K13/08 ; G01N25/00

Abstract:
The thermal analyzer comprises temperature deviation approximation formula holder which holds an approximate formula of a temperature deviation between sample and furnace and an elevating or lowering rate of the temperature of furnace during measuring the temperature deviation, programmed temperature corrector which corrects a programmed temperature in proportion to the elevating or lowering rate of the temperature. So that, since the temperature deviation is corrected in proportion to the elevating or lowering rate of the temperature program, the temperature deviation between sample and furnace is controlled to diminish when heating or cooling the sample using the temperature program which elevates or lowers the temperature of the sample or the furnace.
Public/Granted literature
- US20080000402A1 Thermal analyzer Public/Granted day:2008-01-03
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