Invention Grant
- Patent Title: Fluorescence microscope for which a sample is observed based on the saturation components of fluorescence and fluorescence microscopy method
- Patent Title (中): 基于荧光和荧光显微镜法的饱和组分观察样品的荧光显微镜
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Application No.: US11792304Application Date: 2005-10-14
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Publication No.: US07781711B2Publication Date: 2010-08-24
- Inventor: Katsumasa Fujita , Satoshi Kawata , Osamu Nakamura , Minoru Kobayashi
- Applicant: Katsumasa Fujita , Satoshi Kawata , Osamu Nakamura , Naoko Nakamura, legal representative , Minoru Kobayashi
- Applicant Address: JP Suita-shi, Osaka
- Assignee: Osaka University
- Current Assignee: Osaka University
- Current Assignee Address: JP Suita-shi, Osaka
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2004-355483 20041208
- International Application: PCT/JP2005/018945 WO 20051014
- International Announcement: WO2006/061947 WO 20060615
- Main IPC: G02B7/04
- IPC: G02B7/04

Abstract:
To increase spatial resolution by observing a sample based on saturated fluorescence components. A fluorescence microscope according to the present invention includes: a laser light source 10 emitting laser light as excitation light; an objective lens 13 focusing the laser light and applying the focused laser light to a sample 14; a detector 22 detecting fluorescence generated in the sample 14 with the laser light; and a stage 15 scanning the sample 14 while moving the sample 14 relative to the laser light, wherein the laser light is applied to the sample with varying intensities such that saturation of fluorescence occurs at the maximum intensity of the laser light, and fluorescence is detected with the detector in accordance with intensity of the laser light, and the sample is observed based on the saturation components of fluorescence.
Public/Granted literature
- US20080215272A1 Fluorescence Microscope and Fluorescence Microscope Method Public/Granted day:2008-09-04
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