Invention Grant
- Patent Title: Semiconductor device structure
- Patent Title (中): 半导体器件结构
-
Application No.: US11742955Application Date: 2007-05-01
-
Publication No.: US07781840B2Publication Date: 2010-08-24
- Inventor: Ted R. White , Alexander L. Barr , Bich-Yen Nguyen , Marius K. Orlowski , Mariam G. Sadaka , Voon-Yew Thean
- Applicant: Ted R. White , Alexander L. Barr , Bich-Yen Nguyen , Marius K. Orlowski , Mariam G. Sadaka , Voon-Yew Thean
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent James L. Clingan, Jr.; David G. Dolezal
- Main IPC: H01L29/786
- IPC: H01L29/786

Abstract:
Two different transistors types are made on different crystal orientations in which both are formed on SOI. A substrate has an underlying semiconductor layer of one of the crystal orientations and an overlying layer of the other crystal orientation. The underlying layer has a portion exposed on which is epitaxially grown an oxygen-doped semiconductor layer that maintains the crystalline structure of the underlying semiconductor layer. A semiconductor layer is then epitaxially grown on the oxygen-doped semiconductor layer. An oxidation step at elevated temperatures causes the oxide-doped region to separate into oxide and semiconductor regions. The oxide region is then used as an insulation layer in an SOI structure and the overlying semiconductor layer that is left is of the same crystal orientation as the underlying semiconductor layer. Transistors of the different types are formed on the different resulting crystal orientations.
Public/Granted literature
- US20070235807A1 SEMICONDUCTOR DEVICE STRUCTURE AND METHOD THEREFOR Public/Granted day:2007-10-11
Information query
IPC分类: