Invention Grant
- Patent Title: Multi-signal input testing apparatus
- Patent Title (中): 多信号输入测试仪
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Application No.: US11455914Application Date: 2006-06-19
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Publication No.: US07782045B2Publication Date: 2010-08-24
- Inventor: Chuan-Bang Wang , Yan-Kai Zhang , Yu-Ping Wu , Jun She
- Applicant: Chuan-Bang Wang , Yan-Kai Zhang , Yu-Ping Wu , Jun She
- Applicant Address: CN Shenzhen, Guangdong Province TW Miao-Li County
- Assignee: Innocom Technology (Shenzhen) Co., Ltd.,Chimel Innolux Corporation
- Current Assignee: Innocom Technology (Shenzhen) Co., Ltd.,Chimel Innolux Corporation
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Miao-Li County
- Agent Wei Te Chung
- Priority: TW94210203U 20050617
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/00 ; G01R31/02

Abstract:
An exemplary multi-signal input testing apparatus (2) includes a testing table (20), a transfer table (21) slidably positioned on the testing table, and a pair of multi-signal input devices (25) arranged on the transfer table. Each multi-signal input device includes a pair of connect ends (251, 252). One of the connect ends includes a plurality of pinhole terminals for receiving various testing signals, and the other connect end includes a plurality of connectors for supplying the testing signals to a product to be tested. This means that several tests can be automatically performed by a same multi-signal input testing apparatus at any single testing station. This speeds the testing of the products, and helps promote the efficiency of the testing process. In addition, it can simplify the configuration of various testing equipment and save space. Furthermore, there is little or no need for manual work by operators.
Public/Granted literature
- US20060284641A1 Multi-signal input testing apparatus Public/Granted day:2006-12-21
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