Invention Grant
- Patent Title: Circuit for capacitance measurement and method therefor
- Patent Title (中): 电容测量电路及其方法
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Application No.: US12230825Application Date: 2008-09-05
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Publication No.: US07782068B2Publication Date: 2010-08-24
- Inventor: Yu Kuang
- Applicant: Yu Kuang
- Applicant Address: TW Hsinchu
- Assignee: Raydium Semiconductor Corporation
- Current Assignee: Raydium Semiconductor Corporation
- Current Assignee Address: TW Hsinchu
- Agency: Bacon & Thomas, PLLC
- Priority: TW97110489A 20080325
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
A measurement method for capacitance includes the following steps. First, a voltage on at least one end of a to-be-measured capacitor is switched in response to a first set of clock signals such that a level of an integrated voltage is adjusted from a start voltage level to an end voltage level in a first integration period, wherein a capacitance of the to-be-measured capacitor is relevant to a difference between the end voltage level and the start voltage level. Next, the level of the integrated voltage is adjusted from the end voltage level to the start voltage level in a second integration period in response to a second set of clock signals. Then, the capacitance of the to-be-measured capacitor is obtained according to the first and second integration periods and a known characteristic parameter.
Public/Granted literature
- US20090243631A1 Circuit for capacitance measurement and method therefor Public/Granted day:2009-10-01
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