Exemplary methods are directed to the linearization and characterization of an image producing device. In the method, a color test chart of the device is reproduced and measured based on a small number of color measurement fields with defined device color values. Associated color values are determined for each color measurement field and used to calculate linearization curves for the device. Additionally, by analysis of the device color values, the measured color values, and device behavior, an expanded color test chart with expanded device color values and associated expanded color values is calculated. The number of color measurement fields in the expanded color test chart is larger than the number of color measurement fields in the original color test chart. An ICC profile for the device is calculated from the expanded device color values and the expanded color values.