Invention Grant
US07782591B2 Methods of and apparatus for reducing amounts of particles on a wafer during wafer de-chucking
有权
在晶片去夹紧期间减少晶片上的颗粒量的方法和装置
- Patent Title: Methods of and apparatus for reducing amounts of particles on a wafer during wafer de-chucking
- Patent Title (中): 在晶片去夹紧期间减少晶片上的颗粒量的方法和装置
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Application No.: US11821314Application Date: 2007-06-22
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Publication No.: US07782591B2Publication Date: 2010-08-24
- Inventor: Sangjun Cho , Sean Kang , Tom Choi , Taejoon Han
- Applicant: Sangjun Cho , Sean Kang , Tom Choi , Taejoon Han
- Applicant Address: US CA Fremont
- Assignee: Lam Research Corporation
- Current Assignee: Lam Research Corporation
- Current Assignee Address: US CA Fremont
- Agency: Martine Penilla & Gencarella, LLP
- Main IPC: H05F3/00
- IPC: H05F3/00

Abstract:
Particles are trapped away from a wafer transport zone in a chamber. A first electrode is on one side of the zone. A second electrode is on an opposite side of the zone. A power supply connected across the electrodes establishes an electrostatic field between the electrodes. The field traps particles at the electrodes, away from the zone. For transporting the wafer from the chamber, the second electrode mounts the wafer for processing, and the first electrode is opposite to the second electrode defining a process space. The zone is in the space with a separate part of the space separating the zone from each electrode. Particles are urged away from the wafer by simultaneously terminating plasma processing of the wafer, connecting the second electrode to ground, applying a positive DC potential to the first electrode, and de-chucking the wafer from the second electrode into the zone.
Public/Granted literature
- US20080314733A1 Methods of and apparatus for reducing amounts of particles on a wafer during wafer de-chucking Public/Granted day:2008-12-25
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