Invention Grant
- Patent Title: X-ray imaging system having improved weather resistance
- Patent Title (中): 具有改善耐候性的X射线成像系统
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Application No.: US12275386Application Date: 2008-11-21
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Publication No.: US07783005B2Publication Date: 2010-08-24
- Inventor: Brian Kaval
- Applicant: Brian Kaval
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Patentmetrix
- Main IPC: G01N23/04
- IPC: G01N23/04
Abstract:
It is an object of the present invention to provide a radiation inspection system, such as an X-ray system, that can operate efficiently even in inclement weather conditions while being highly mobile. Thus the improved inspection system of the present invention is capable of operating in high temperature and corrosive environments and is designed to withstand moisture, dirt and/or dust from the articles of inspection as well.
Public/Granted literature
- US20090141863A1 X-Ray Imaging System Having Improved Weather Resistance Public/Granted day:2009-06-04
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